Tel: 520.465.1419 E-mail : araca@aracainc.com

Process and Consumables Co-Development

We have been working closely with our clients to co-develop customized CMP, polishing and cleaning processes and consumables for 50 to 300 mm applications. Co-development is at times performed entirely at the customers’ sites using their processing and metrology equipment with specific inputs from our scientists on the incorporation of best-known methods (BKMs). Co-development can also initially take place at Araca Inc. using our equipment and BKMs followed by tech-transfer to our customers.

Please refer to our Pad Functional Testing Services Brochure as an example of what we have done on pad functional testing.

Our co-development activities have so far been in the following areas:

  • Novel pads, retaining rings and conditioning discs.
  • Customized copper, tungsten, tantalum and titanium planarization.
  • DRAM and 3D NAND structure delayering via CMP.
  • Through Glass Via (TGV) planarization and polishing.
  • Totally out of the box, and disruptive, work for next generation planarization applications.
  • Silicon carbide and GaN substrate polishing.

Please contact us for a free consultation on how we may be able to assist you in reaching your process and consumables development objectives.

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